Semiconductor Monitoring Burn-in Test Chamber

Key Features

  • Uniform high accurate and reliable temperature control
  • Easy of operation and simplicity
  • Friendly, flexible, up-to date control and management systems
  • Allows easy servicing and upgrades
  • Selectable between manual door type (BTC 1000) and automatic door type (BTC 2000)
  • Computer control is available
  • Network connection of several chambers to a single “master” control unit allowing centralized supervision both in local and remote mode

Advantages

  • High accuracy
  • High stability & uniformity
  • Equipped with multiple safety devices .
  • Equipped with viewing window 
  • Equipped with Automatic/Manual door

Application

  • Quality & reliability testing
  • Durability testing
  • Operating status of parts and products in extreme conditions.

Technical Data

Temperature range40 ~ 150 (changeable according to user’s demand)
Temperature uniformityLess than ± 0.5
Temperature rising timeRT to 125 less than 50 minutes
Temperature cooling time125 to RT less than 50 minutes
Cool own rateMore than 1~5 /min
Input power requirements230V ±10%, 380V ±10%, 50Hz/60Hz, 1Ph/3Ph
No. of slots for BIB (Burn in Board)48