Unites Unimet 2020/1037

Discrete Semiconductor Component Tester

UNIMET 2020 represents a unique and flexible mixed signal test platform for measuring wide range of components. UNIMET 2020 is fully compatible with SZ M3000 test system. UNIMET can be extended by dozens of test adapters with hundreds of ready-made test program

UNIMET 1037 is laboratory benchtop test system for discrete semiconductors such as bipolar transistors, IGBTs, MOSFETs, diodes, Zener diodes, triacs and thyristors. Advanced dynamic measurements are available with TA37.TIM extension. Detachable TA37 can be used as well with M3000, UNIMET 3000 and UNIMET 2020. UNIMET 1037 allows fast and simple drag & drop test application development. Testing discrete semiconductors has never been easier!

Key Features

  • Discrete semiconductors (Transistors, Diodes, MOS-FETs, JFETs, etc.)
  • OpAmps
  • Analog and Digital ICs
  • Linear devices
  • Passive devices
  • Hybrid devices
  • Mixed signal devices
  • Power management
  • Smart power devices
  • Voltage regulators
  • Optocouplers
  • AD / DA converters
  • Memories

Test Adapters

Testing Architecture

Fields Of Application

  • Radiation testing (electrical parametric tests)
  • Component qualification
  • Low volume production testing (connection to handler via TCP/IP, IOs or RS232)
  • Engineering testing
  • Quality control
  • Functional testing
  • Diagnostics
  • Failure analysis
  • Substitute of the LTS 2020 tester
  • Substitute of the Deltest tester