JT 5705 Mixed-signal JTAG Controller

The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.
Use the ‘mixed-signal’ features to measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of Core Commander FPGA our generic bridge/translator system.
The JT 5705/USB version (pictured right) is a desktop model with 2 TAPs and 64 I/O making it ideal for hardware validation or small-scale production test. Maximum TCK speed is 15 MHz and all voltages are fully programmable. The JT5705/FXT is the ‘fixture’ version supplied as a pcb assembly only with optional ‘break-out’ boards available depending on your application.

Features

  • 2 TAPs
  • Up to 64 MIOS Channels
  • Measures Frequency
  • Up to 8 Analog IO
  • USB Interface

Specification

  • Two 1149.x compliant Test Access Ports
  • TCK up to 15 MHz
  • 64 I/O channels
  • 8 Analog Input or Output channels (taken from channels 57- 64)
  • Generated value has an accuracy of +/- 0.45%
  • Measured value has an accuracy of +/- (0.4% + 100mV)
  • Frequency measurements, range 0- 200 MHz (channels 33-48) 
  • Pulse width counter, range 4 – 8192 nS (channel 35 only)
  • Frequency generator, range 0 – 62.5 MHz (channel 33 only)

JT 5705/FXT CARRIERS

The use of JTAG/Boundary-scan combined with a number of mixed signal IO channels brings a new dimension to the bench-top ATE market. The JT 5705/FXT is a highly compact (less than 10cm x10cm) multifunction USB-powered instrument in its own right and offers two full JTAG TAPs (Test Access Ports) and 64 IO channels with a combination of Digital, Analog and Frequency measurement capabilities. The matching JT 2702/xx range of carrier boards have been designed to allow seamless integration of this powerful capability into an array of popular bench fixtures.

Features

  • Support for ATX, D&D, ECT, Ingun, MG Products, and others
  • JT 2702/xx (choose your connection method)
  • JT 5705/FXT (2 TAPs + 64 multifunctional I/Os)
  • JT 5112/FXT (64 multifunctional I/Os)

Specification

Two 1149.x compliant Test Access Ports

  • TCK up to 15 MHz
  • 64 I/O channels
  • 8 Analog Input or Output channels (taken from channels 57- 64)
  • Generated value has an accuracy of +/- 0.45%
  • Measured value has an accuracy of +/- (0.4% + 100mV)
  • Frequency measurements, range 0- 200 MHz (channels 33-48)
  • Pulse width counter, range 4 – 8192 nS (channel 35 only)
  • Frequency generator, range 0 – 62.5 MHz (channel 33 only)

JT 2702/IB

  • 1 site for JT5705/FXT or JT5112/FXT,
  • Optional signal multiplexors for increased channel count
  • Designed for ‘Pylon’ style connectors

JT 2702/BO

  • 1 site for JT 5705/FXT or JT 5112/FXT
  • Generic solution for all fixture systems using IDC connectors

JT 57××/RMIC

The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.

Features

  • Four module slots for controller, digital IO or MIOS
  • Up to 256 I/O channels and eight TAPs in total
  • High-speed (15MHz) and ultra-high-speed (40MHz) controller options
  • Measurement options for frequency, pulse-width and VDC (analog)
  • Analog source and clock generator